Project

# Title Team Members TA Documents Sponsor
40 Bilateral Earlobe Pulse Timing Measurement Device
Joshua Joseph
Mark Schmitt
Zhikuan Zhang
Shiyuan Duan design_document1.pdf
other1.pdf
# Bilateral Earlobe Pulse Timing Measurement Device

# Team Members
Zhikuan Zhang (zhikuan2)
Joshua Joseph (jgj3)
Mark Schmitt (markfs2)


# Problem
Pulse transit time (PTT) is widely used as a non invasive indicator of cardiovascular dynamics but most existing systems measure PTT at a single peripheral location There is currently a lack of low cost synchronized hardware tools that enable bilateral pulse timing measurements such as comparing pulse arrival times between the left and right earlobes

Without a dedicated time synchronized multi channel sensing platform it is difficult to study or validate whether body posture head orientation or environmental conditions introduce measurable bilateral timing differences This project addresses the need for a custom PCB based physiological sensing device that can reliably acquire synchronized ECG and bilateral PPG signals and serve as a general purpose measurement tool for this under studied topic

# Solution
This project proposes a PCB based multi channel physiological sensing system consisting of one ECG channel placed near the chest and two PPG channels placed on the left and right earlobes The system is designed as a measurement and validation tool rather than a research discovery platform

The PCB focuses on low noise analog front end design precise time synchronization and multi channel data acquisition ECG R peaks are used as a timing reference and pulse arrival times from both PPG channels are compared under controlled conditions such as neutral posture head tilt or side lying

# Solution Components

## Subsystem 1 ECG Analog Front End
Function Acquire a clean ECG signal to provide a reliable cardiac timing reference

Components
Instrumentation amplifier such as AD8232 or equivalent ECG analog front end
Analog high pass and low pass filtering stages
Driven right leg circuit for common mode noise reduction
Surface ECG electrodes

Output
Digitized ECG waveform with clearly detectable R peaks

## Subsystem 2 Dual PPG Sensing Channels
Function Measure pulse waveforms at the left and right earlobes simultaneously

Components
Two identical PPG sensors such as MAX30102 or discrete LED and photodiode design
Transimpedance amplifiers for photodiode current sensing
Anti aliasing filters
Optical shielding for ambient light rejection

Output
Two synchronized PPG waveforms suitable for pulse arrival time extraction

## Subsystem 3 Time Synchronized Data Acquisition and Control
Function Ensure accurate relative timing between ECG and both PPG channels

Design considerations
All channels are sampled by a single microcontroller ADC or synchronized ADCs
Shared clock source using a low ppm crystal oscillator
Hardware level timestamping of samples
Avoid reliance on BLE timing for synchronization BLE used only for data transfer if implemented

Components
Microcontroller such as STM32 or ESP32
Low drift crystal oscillator
Shared sampling clock architecture

# Criterion For Success

Requirement 1 ECG signal acquisition
Validation Clearly visible ECG waveform with identifiable R peaks Elevated heart rate observable after light exercise

Requirement 2 PPG signal acquisition for both earlobes
Validation Stable and repeatable PPG waveforms captured simultaneously from left and right earlobes

Requirement 3 Channel time synchronization
Validation Relative timing jitter between channels below predefined threshold such as less than 1 ms Consistent timing results across repeated measurements

Requirement 4 Bilateral pulse timing comparison
Validation ECG referenced pulse arrival times successfully computed for both earlobes under at least two different body conditions

# Scope and Complexity Justification
This project involves significant circuit level hardware design including low noise analog front ends synchronized multi channel data acquisition and mixed signal PCB integration The system complexity is appropriate for a senior design project and aligns with course expectations

The project is inspired by experience working as a research assistant in a biological sensing laboratory and is positioned as a hardware measurement tool rather than a research discovery platform

Four Point Probe

Simon Danthinne, Ming-Yan Hsiao, Dorian Tricaud

Four Point Probe

Featured Project

# Four Point Probe

Team Members:

Simon Danthinne(simoned2)

Ming-Yan Hsiao(myhsiao2)

Dorian Tricaud (tricaud2)

# Problem:

In the manufacturing process of semiconductor wafers, numerous pieces of test equipment are essential to verify that each manufacturing step has been correctly executed. This requirement significantly raises the cost barrier for entering semiconductor manufacturing, making it challenging for students and hobbyists to gain practical experience. To address this issue, we propose developing an all-in-one four-point probe setup. This device will enable users to measure the surface resistivity of a wafer, a critical parameter that can provide insights into various properties of the wafer, such as its doping level. By offering a more accessible and cost-effective solution, we aim to lower the entry barriers and facilitate hands-on learning and experimentation in semiconductor manufacturing.

# Solution:

Our design will use an off-the-shelf four point probe head for the precision manufacturing tolerances which will be used for contact with the wafer. This wafer contact solution will then be connected to a current source precisely controlled by an IC as well as an ADC to measure the voltage. For user interface, we will have an array of buttons for user input as well as an LCD screen to provide measurement readout and parameter setup regarding wafer information. This will allow us to make better approximations for the wafer based on size and doping type.

# Solution Components:

## Subsystem 1: Measurement system

We will utilize a four-point probe head (HPS2523) with 2mm diameter gold tips to measure the sheet resistance of the silicon wafer. A DC voltage regulator (DIO6905CSH3) will be employed to force current through the two outer tips, while a 24-bit ADC (MCP3561RT-E/ST) will measure the voltage across the two inner tips, with expected measurements in the millivolt range and current operation lasting several milliseconds. Additionally, we plan to use an AC voltage regulator (TPS79633QDCQRQ1) to transiently sweep the outer tips to measure capacitances between them, which will help determine the dopants present. To accurately measure the low voltages, we will amplify the signal using an JFET op-amp (OPA140AIDGKR) to ensure it falls within the ADC’s specifications. Using these measurements, we can apply formulas with corrections for real-world factors to calculate the sheet resistance and other parameters of the wafer.

## Subsystem 2: User Input

To enable users to interact effectively with the measurement system, we will implement an array of buttons that offer various functions such as calibration, measurement setup, and measurement polling. This interface will let users configure the measurement system to ensure that the approximations are suitable for the specific properties of the wafer. The button interface will provide users with the ability to initiate calibration routines to ensure accuracy and reliability, and set up measurements by defining parameters like type, range, and size tailored to the wafer’s characteristics. Additionally, users can poll measurements to start, stop, and monitor ongoing measurements, allowing for real-time adjustments and data collection. The interface also allows users to make approximations regarding other wafer properties so the user can quickly find out more information on their wafer. This comprehensive button interface will make the measurement system user-friendly and adaptable, ensuring precise and efficient measurements tailored to the specific needs of each wafer.

## Subsystem 3: Display

To provide output to users, we will utilize a monochrome 2.4 inch 128x64 OLED LCD display driven over SPI from the MCU. This display will not only present data clearly but also serve as an interface for users to interact with the device. The monochrome LCD will be instrumental in displaying measurement results, system status, and other relevant information in a straightforward and easy-to-read format. Additionally, it will facilitate user interaction by providing visual feedback during calibration, measurement setup, and polling processes. This ensures that users can efficiently navigate and operate the device, making the overall experience intuitive and user-friendly.

# Criterion for Success:

A precise constant current can be run through the wafer for various samples

Measurement system can identify voltage (10mV range minimum) across wafer

Measurement data and calculations can be viewed on LCD

Button inputs allow us to navigate and setup measurement parameters

Total part cost per unit must be less than cheapest readily available four point probes (≤ 650 USD)

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